BAY AREA AIR QUALITY
MANAGEMENT DISTRICT |
Source Category
| Source: | Semiconductor Fabrication - Photoresist Operations | Revision: | 2 |
| Document #: | 149A.1.1 | ||
| Class: | All | Date: | 06/16/95 |
Determination
POLLUTANT |
BACT 1. Technologically Feasible/ Cost Effective 2. Achieved in Practice |
TYPICAL TECHNOLOGY |
| POC | 1. n/d 2. Enclosure of photoresist track and spinner, and vent to abatement system w/ destruction/recovery efficiency >98.5% or VOC outlet concentration <10 ppmva,b,T |
1. n/d 2. BAAQMD approved Collection System and Abatement Devicea,b,T |
| NOx | 1. n/a 2. n/a |
1. n/a 2. n/a |
| SO2 | 1. n/a 2. n/a |
1. n/a 2. n/a |
| CO | 1. n/a 2. n/a |
1. n/a 2. n/a |
| PM10 | 1. n/a 2. n/a |
1. n/a 2. n/a |
| NPOC | 1. n/d 2. Same as for POC abovea,b,T |
1. n/d 2. BAAQMD approved Collection system and Abatement Devicea,b,T |
References
| a. BAAQMD A #6266 b. For abatement device, the following are acceptable: <10 ppmv at outlet; or >98.5% destruction/recovery efficiency if inlet VOC >2000 ppmv: or >97% efficiency if inlet VOC >200 to <2000 ppmv; or >90% efficiency if inlet VOC <200 ppmv. T. TBACT |